主要技术内容
This standard is suitable for the measurement of the real part of the relative permittivity and the loss tangent of silicon oxide, aluminum oxide, aluminum nitride, zirconia, boron nitride, silicon carbide, barium titanate and other inorganic materials, printed circuit boards and other organic-inorganic composite boards, polytetrafluoroethylene, polystyrene and other organic engineering plastics. It is also suitable for other similar solid dielectric, composite plate, engineering plastic material and its liquid crystal polymer, modified polyimide and other thin film samples.
适用范围
This document specifies the method of measuring the real part of the relative permittivity and loss tangent of solid dielectric, composite plate, engineering plastics and other materials in the frequency range of 20 GHz ~ 110 GHz by using a confocal type open resonator. The measurement range of the real part of the relative permittivity is from 2 to 30, and the measurement range of loss tangent is from 0.0001 to 0.05.
是否包含专利
否
